INFICON 新闻

了解更多关于我们的产品和服务

Webinar HP100
网络研讨会

INFICON Quantus® HP100

地点
Online
语言
English
发言人
Huidong Zang
时间
1 hour

Description

A Newly Developed Optical Gas Analyzer for Semiconductor Manufacturing

This webinar will present an overview of the newly developed optical gas analyzer, Quantus HP100, based on self-plasma optical emission spectroscopy technology.

As a sister gas analyzer for the market-proven Quantus LP100 under the INFICON optical sensor portfolio, Quantus HP100 provides unparalleled performance to many critical semiconductor applications, such as leak detection, endpoint detection and gas analysis.  

It has a much broader operational pressure range - up to 450 Torr without a pumping system - and it boosts the detection limit down to sub-ppm level. 

Related webinars

网络研讨会
How to increase efficiency in vacuum leak testing with I·Zero
50 min
English
更多信息
网络研讨会
Find the Best Pirani Gauge for Your Vacuum Application
52 min
English
更多信息
网络研讨会
Have your process under control with Augent OPG550

Intelligent solution for real-time vacuum gas monitoring

40 min
English
更多信息
网络研讨会
Factory Optimization - How to measure your factory performance

Part I

50 min
English
更多信息
网络研讨会
Factory Optimization - Part II

How to measure your factory performance

50 min
English
更多信息
网络研讨会
Factory Optimization - Part III

How to measure your factory performance

50 min
English
更多信息
网络研讨会
Is Your Pressure under Control?
Pressure Control and Monitoring in SEMI ALD Processes
1 h
English
更多信息
网络研讨会
Optical revolution in vacuum pressure & gas composition measurement
35 min
English
更多信息
网络研讨会
UL6000 Fab - The ultimate in vacuum leak testing
17 min
English
更多信息
网络研讨会
QCM Sensor Installation & Maintenance
多个日期
1 hour
English
更多信息
网络研讨会
Choosing the Right QCM System for Your Application

In this webinar we will discuss some common applications in the optical, OLED, and solar industry. We will unpack a list of unique key features exclusively offered by INFICON that are tailored to your application

多个日期
1 hour
English
更多信息
网络研讨会
Transpector APX

Our new Gas Analyzer. Product introduction, availability, successful implementations of pre-production systems

35 minutes
English
更多信息
网络研讨会
QCM Troubleshooting
30 min
English
更多信息
网络研讨会
SemiQCM - Semiconductor Manufacturing Solutions
24 min
English
更多信息
网络研讨会
Protective Atomic Layer Deposition Coatings on complex parts
1 hour
English
更多信息
网络研讨会
Mastering Vacuum Measurements

A Basic Guide to Capacitive Vacuum Gauges

36 minutes
English
更多信息
网络研讨会
QCMs and Thin Film Processes in Semi

QCM use in the semiconductor industry for processes like ALD, E-beam, resistive source and sputtering.

22 minutes
English
更多信息
网络研讨会
Temperature Compensation for QCMs

Quartz crystal microbalance (QCM) technology has been used for decades to control deposition rate and thickness for the most complex processes seen in the ophthalmic, optical, display, and solar markets. INFICON has recently made a new advancement in QCM technology to address a problem seen across all of these industries related to QCM temperature effects. Thermal shock can cause QCM thickness errors which can decrease yield and increase manufacturing costs if temperature is not accounted for correctly.

Temperature impacts the frequency measurement and can create false mass readings. Thin film deposition controllers currently on the market have no good way of distinguishing frequency shifts related to mass from frequency shifts related to temperature, resulting in thickness errors and poor PID control. This can be detrimental to complex coating processes due to the low deposition rates and incredibly thin layers required. Thermal shocks can occur at any point in a deposition process and can cause unnecessary PID-loop corrections, triggering non-uniform deposition in respect to time. This means that the quality throughout the bulk of the material is inadequate. For very thin films, the thickness termination may not be at the real intended thickness because the process time window is small compared to the time allowed for a QCM to recover from a thermal shock event.

INFICON has patented a new temperature compensation technique for SC-cut crystals to remove the effects of temperature variation on the QCM without the need for additional hardware or custom and expensive sensors.

Please join us for the ‘Temperature Compensation for QCMs’ webinar, hosted by Sheldon Wayman, Product Engineer for INFICON Inc.

20 minutes
English
更多信息
网络研讨会
SMART-Spray, I·BOOST, SPRAY-Check

Smart essentials for intelligent leak detection

33 minutes
English
更多信息
网络研讨会
Introducing Trigon™

A new future proof Hot Ion Gauge generation from INFICON

更多信息
网络研讨会
FabTime®: Improve Fab Cycle Time by Tracking the Right Equipment Reliability Metrics

Most people, when asked, cite equipment downtime as a top contributor to cycle time in their wafer fabs. Downtime impacts cycle time by taking away buffer capacity (driving tools to a steeper part of the operating curve), increasing process time variability (because lots must wait during downtime events), and reducing the available number of qualified tools during a given day or shift. Understanding these effects suggests specific metrics that are helpful for driving cycle time improvement and other metrics that are less useful. In this webinar, Dr. Jennifer Robinson, Cycle Time Evangelist for INFICON, will teach participants to select the best downtime metrics and operating practices for cycle time improvement. The session will include chart examples from the FabTime® reporting module.

11 Dec 2024 | 5:00 PM (UTC +2)
60 minutes
English
更多信息
我们需要您的视频内容同意
更多信息
https://www.inficon.com/admin/#/articles/en/webinar/da294c5c-fb6e-40da-9b44-c6a7384e40e9