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FabTime®: Improve Fab Cycle Time by Tracking the Right Equipment Reliability Metrics
About the webinar
Most people, when asked, cite equipment downtime as a top contributor to cycle time in their wafer fabs. Downtime impacts cycle time by taking away buffer capacity (driving tools to a steeper part of the operating curve), increasing process time variability (because lots must wait during downtime events), and reducing the available number of qualified tools during a given day or shift. Understanding these effects suggests specific metrics that are helpful for driving cycle time improvement and other metrics that are less useful. In this webinar, Dr. Jennifer Robinson, Cycle Time Evangelist for INFICON, will teach participants to select the best downtime metrics and operating practices for cycle time improvement. The session will include chart examples from the FabTime® reporting module.