Erfahren Sie mehr über unsere Produkte und Dienstleistungen.
SMART-Spray, I·BOOST, SPRAY-Check:
Smart essentials for intelligent leak detection
About the webinar
Join our webinar to discover our intelligent add-ons for the UL family of leak detectors: the SMART-Spray helium spray gun, I·BOOST software, and SPRAY-Check test leak. Markus Schwambera, our Product Manager, will dive into the technical details, demonstrating the ease of handling, precision, and time-saving benefits of these groundbreaking solutions.
During the webinar, following topics will be covered:
- SMART-Spray: eliminate the hassle of helium bottles and manual flow adjustments.
- I·BOOST: accelerate leak testing with advanced signal processing.
- SPRAY-Check: verify your test setup in leak rate ranges of 1E-8 mbarL/s.
Don't miss this opportunity to stay ahead of the curve in leak detection technology.
Related webinars
Für Ihre Vakuumanwendung
Basiswissen einfach und praxisnah erklärt
Wie Sie die zulässige Dichtheit Ihres Produkts bestimmen und sicherstellen
Die intelligente Lösung zur Vakuum-Gasüberwachung in Echtzeit
Wie messen Sie die Performance Ihrer Produktion?
Wie messen Sie die Performance Ihrer Produktion?
Wie messen Sie die Performance Ihrer Produktion?
Drucksteuerung und -überwachung bei SEMI ALD Prozessen
mit dem Augent OPG550
In this webinar we will discuss some common applications in the optical, OLED, and solar industry. We will unpack a list of unique key features exclusively offered by INFICON that are tailored to your application
The official market launch of the Transpector APX.
Join this webinar for the official market launch of the Transpector APX, where we will cover the new product introduction, advantages, availability, as well as successful implementations of pre-production systems in the field at customer sites.
A multitool for safety leak check on city gas distribution pipes systems.
A new future proof Hot Ion Gauge generation from INFICON
A Basic Guide to Capacitive Vacuum Gauges
QCM use in the semiconductor industry for processes like ALD, E-beam, resistive source and sputtering.
Quartz crystal microbalance (QCM) technology has been used for decades to control deposition rate and thickness for the most complex processes seen in the ophthalmic, optical, display, and solar markets. INFICON has recently made a new advancement in QCM technology to address a problem seen across all of these industries related to QCM temperature effects. Thermal shock can cause QCM thickness errors which can decrease yield and increase manufacturing costs if temperature is not accounted for correctly.
Temperature impacts the frequency measurement and can create false mass readings. Thin film deposition controllers currently on the market have no good way of distinguishing frequency shifts related to mass from frequency shifts related to temperature, resulting in thickness errors and poor PID control. This can be detrimental to complex coating processes due to the low deposition rates and incredibly thin layers required. Thermal shocks can occur at any point in a deposition process and can cause unnecessary PID-loop corrections, triggering non-uniform deposition in respect to time. This means that the quality throughout the bulk of the material is inadequate. For very thin films, the thickness termination may not be at the real intended thickness because the process time window is small compared to the time allowed for a QCM to recover from a thermal shock event.
INFICON has patented a new temperature compensation technique for SC-cut crystals to remove the effects of temperature variation on the QCM without the need for additional hardware or custom and expensive sensors.
Please join us for the ‘Temperature Compensation for QCMs’ webinar, hosted by Sheldon Wayman, Product Engineer for INFICON Inc.
CrystalSix and Crystal 12 are rotary Quartz Crystal Monitors utilized in OLED, Solar and Semiconductor applications, to name a few. QCMs like these also sometimes require user troubleshooting and maintenance to ensure good connectivity as well as crystal positioning within the aperture. During this webinar you will learn about the CrystalSix and Crystal12 and best practices to troubleshoot and maintain them.
Most people, when asked, cite equipment downtime as a top contributor to cycle time in their wafer fabs. Downtime impacts cycle time by taking away buffer capacity (driving tools to a steeper part of the operating curve), increasing process time variability (because lots must wait during downtime events), and reducing the available number of qualified tools during a given day or shift. Understanding these effects suggests specific metrics that are helpful for driving cycle time improvement and other metrics that are less useful. In this webinar, Dr. Jennifer Robinson, Cycle Time Evangelist for INFICON, will teach participants to select the best downtime metrics and operating practices for cycle time improvement. The session will include chart examples from the FabTime® reporting module.